SURRO Inspection connects to existing inspection equipment to automate visual defect detection, unify inspection data, trigger follow-up actions, and support model retraining. It can classify defects, locate and segment affected areas, and flag previously unseen anomaly candidates.
The brochure covers DFM for inspection data standardization, SVI for defect detection and visualization, AQM for auto-labeling and retraining, deployment examples across semiconductors, electronics, medical devices, and precision manufacturing, as well as the implementation process and system requirements.